Product Function Introduction 

u Automatically test and calculate various parameters such as IL, PDL, RLin, RLout, ISO, CT, WDL, TDL, etc.

u Circulator compatible device and module \ chassis scanning test. Support high and low temperature test, automatic delay control of temperature rise and fall.

u Isolator supports the simultaneous testing of 4 devices, using high and low temperature waiting time to improve test productivity and efficiency.

u Automatically determine various complex grades for product grade selection.

u Automatically determine the test results; all data is saved in a large amount through the SQL Server database, and shipment reports are automatically generated in batches.

Schematic diagram of test interface

System Performance Index

Solution configuration