Product Function Introduction

u Make full use of the low utilization rate of the broadband light source and the spectrum analyzer to realize the sharing of the broadband light source and the spectrometer, which can be used for the four test stations to time-multiplex and execute the test.

u Compatible with CWDM device and module scanning test. Support high and low temperature test, automatic delay control of temperature rise and fall.

u Automatically scan and calculate various parameters such as ITU IL, Min IL, Max IL, Ripple, TDL, Isolation, and CWL, Bandwidth under different dB values.

u Compatible with complex scanning test and calculation of CWDM modules, such as WDM modules that mix EXP, UPG, Coupler devices and Monitor channels, or special modules that combine multiple modules such as MUX/DEMUX, TX/RX.

u Automatically determine the test results; all data is saved in a large amount through the SQL Server database, and shipment

reports are automatically generated in batches.

Schematic diagram of test interface

System Performance Index

 

Solution configuration